Quantitative Scanning Probe Microscopy for Nanomechanical Forensics.

نویسندگان

  • F W DelRio
  • R F Cook
چکیده

Atomic force microscopy (AFM) was used to assess the indentation modulus Ms and pull-off force Fpo in four case studies of distinct evidence types, namely hair, questioned documents, fingerprints, and explosive particle-surface interactions. In the hair study, Ms decreased and Fpo increased after adding conditioner and bleach to the hair. For the questioned documents, Ms and Fpo of two inks were markedly different; ballpoint pen ink exhibited smaller variations relative to the mean value than printer ink. The fingerprint case study revealed that both maximum height and Fpo decreased over a three-day period. Finally, the study on explosive particle-surface interactions illustrated that two fabrics exhibited similar Ms, but different Fpo. Overall, it was found that AFM addresses needs in forensic science as defined by several federal agencies, in particular an improved ability to expand the information extracted from evidence and to quantify its evidentiary value.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

Scanning impedance microscopy (SIM): A novel approach for AC transport imaging

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...

متن کامل

Scanning impedance microscopy (SIM): A novel approach for AC transport imaging

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...

متن کامل

A highly sensitive atomic force microscope for linear measurements of molecular forces in liquids

We describe a highly improved atomic force microscope for quantitative nanomechanical measurements in liquids. The main feature of this microscope is a modified fiber interferometer mounted on a five axis inertial slider which provides a deflection sensitivity that is significantly better than conventional laser deflection based systems. The measured low noise floor of 572.0 fm/ Hz provides exc...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:
  • Experimental mechanics

دوره 57 7  شماره 

صفحات  -

تاریخ انتشار 2017